14 August 2018 Characterizing subpixel spatial resolution of a hybrid CMOS detector
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Soft x-rays (0.1 to 10 keV) will liberate between tens and thousands of electrons from the absorber array of a depleted silicon detector. These electrons tend to diffuse outward into what is referred to as the charge cloud, which is then picked up by several pixels and forms a specific pattern based on the exact incident location of the x-ray. By performing the first ever application of a “mesh experiment” on a hybrid CMOS detector (HCD), we have experimentally determined the charge cloud shape and used it to perform subpixel localization of incident x-rays on a photon-by-photon basis for a custom 36-μm pixel pitch H2RG HCD. We find that significant spatial resolution improvement is possible for all events, with 68% confidence regions equal to 7.1  ×  7.1, 0.4  ×  7.1, and 0.4  ×  0.4  μm for 1-pixel, 2-pixel, and 3- to 4-pixel events, respectively. This represents a much finer resolution than that provided by containment within a single pixel.
© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE)
Evan Bray, Evan Bray, Abraham Falcone, Abraham Falcone, Mitchell Wages, Mitchell Wages, Tanmoy Chattopadhyay, Tanmoy Chattopadhyay, David N. Burrows, David N. Burrows, "Characterizing subpixel spatial resolution of a hybrid CMOS detector," Journal of Astronomical Telescopes, Instruments, and Systems 4(3), 038002 (14 August 2018). https://doi.org/10.1117/1.JATIS.4.3.038002 . Submission: Received: 17 April 2018; Accepted: 26 July 2018
Received: 17 April 2018; Accepted: 26 July 2018; Published: 14 August 2018


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