12 March 2012 Polarization-interferometry-based wavelength-interrogation surface plasmon resonance imager for analysis of microarrays
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Polarization interferometry (PI) techniques, which are able to improve surface plasmon resonance (SPR) sensing performance and reduce restrictions on allowable parameters of SPR-supporting metal films, have been experimentally realized only in SPR sensors using monochromatic light as a source. Wavelength-interrogation SPR sensors modulated by PI techniques have not been reported due to the wavelength-sensitive characterization of PI phase compensators. In this work we develop a specially designed rhombic prism for phase compensating which is totally insensitive to wavelength. For the first time we successfully apply PI technique to a wavelength-interrogation SPR imager. This imager is able to offer two-dimensional imaging of the whole array plane. As a result of PI modulation, resolutions of 1.3×10−6 refractive index unit (RIU) under the normal condition and 3.9×10−7 RIU under a more time-consuming condition are acquired. The application of this imager was demonstrated by reading microarrays for identification of bacteria, and SPR results were confirmed by means of fluorescence imaging.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE)
Zhiyi Liu, Heng Shi, Xinyuan Chong, Suihua Ma, Jihua Guo, Hui Ma, Yonghong He, Le Liu, Xiaoxiao Wang, Yanhong Ji, "Polarization-interferometry-based wavelength-interrogation surface plasmon resonance imager for analysis of microarrays," Journal of Biomedical Optics 17(3), 036002 (12 March 2012). https://doi.org/10.1117/1.JBO.17.3.036002 . Submission:

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