EDITORIAL
SPECIAL SECTION ON HUMAN VISION AND ELECTRONIC IMAGING
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1336802
TOPICS: Visualization, Visual process modeling, Image compression, Image quality, Electronic imaging, Human vision and color perception, Imaging systems, Image visualization, Eye, Digital libraries
Andrew Watson, Quingmin Hu, John McGowan
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329896
TOPICS: Video, Data modeling, Visualization, Video compression, Quantization, Human vision and color perception, Spatial frequencies, Visibility, Error analysis, Mathematical modeling
Scott Daly, Kristine Matthews, Jordi Ribas-Corbera
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1333679
TOPICS: Visualization, Quantization, Visual process modeling, Image quality, Linear filtering, Eye, Computer programming, Video, Visual compression, Image resolution
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1335529
TOPICS: Image quality, Image quality standards, Quality measurement, Image processing, Telecommunications, Imaging systems, Standards development, Video, Electronic imaging, Sensors
Christoph Zetzsche, Gerhard Krieger
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1333056
TOPICS: Neurons, Linear filtering, Nonlinear filtering, Independent component analysis, Statistical analysis, Image filtering, Computer programming, Wavelets, Electronic filtering, Image processing
Otto MacLin, Michael Webster
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1330573
TOPICS: Imaging arrays, Visualization, Colorimetry, Visual system, Facial recognition systems, Image processing, Nose, Modulation, Color vision, Head
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1333678
TOPICS: Diamond, Visual process modeling, Visualization, Image processing, Reflectivity, Sun, Data modeling, Retina, Transparency, Receptors
Lawrence Stark, Claudio Privitera, Huiyang Yang, Michela Azzariti, Yeuk Ho, Theodore Blackmon, Dimitri Chernyak
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329895
TOPICS: Visualization, Visual process modeling, Brain, Eye, Visual cortex, Human vision and color perception, Cameras, Neuroimaging, Image processing, 3D modeling
Kerstin Schill, Elisabeth Umkehrer, Stephan Beinlich, Gerhard Krieger, Christoph Zetzsche
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329627
TOPICS: Eye, Sensors, Motion analysis, Eye models, Complex systems, Image processing, Statistical analysis, Nonlinear filtering, Computing systems, Process modeling
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1333677
TOPICS: Visualization, Target detection, Databases, Feature extraction, Image filtering, Performance modeling, Visual process modeling, Image processing, Neurons, Convolution
Thomas Papathomas, Ingemar Cox, Peter Yianilos, Matt Miller, Thomas Minka, Tiffany Conway, Joumana Ghosn
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1333058
TOPICS: Image retrieval, Databases, Image enhancement, Data modeling, Detection and tracking algorithms, Performance modeling, Digital imaging, Visualization, Human-machine interfaces, Image processing
Roger Browse, James Rodger, Robert Adderley
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1330574
TOPICS: Visualization, Light sources, Light sources and illumination, Computer graphics, 3D displays, Error analysis, Reflectivity, Human-machine interfaces, Computer vision technology, Information science
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1336803
TOPICS: Product engineering, Visualization, Data modeling, Visual process modeling, Colorimetry, Gold, Computer aided design, Manufacturing, Tolerancing, Nomenclature
SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTION
SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONIMAGE UNDERSTANDING AND SCENE ANALYSIS
Gaetan Delcroix, Ralph Seulin, Bernard Lamalle, Patrick Gorria, Fred Merienne
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1314333
TOPICS: Light sources and illumination, Image processing, Defect detection, Reflectivity, Cameras, Inspection, Image filtering, Chemical elements, Imaging systems, Sensors
Edwige Pissaloux
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1316090
TOPICS: Image segmentation, Image processing, Image processing algorithms and systems, Image fusion, Performance modeling, Computer programming, Data communications, Data modeling, Telecommunications, Convolution
Donald Bailey
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329337
TOPICS: Image processing, Point spread functions, Image resolution, Sensors, Cameras, Image fusion, Linear filtering, Imaging systems, Distortion, Phase shifts
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329626
TOPICS: RGB color model, Sensors, Cameras, Image analysis, Photons, Error analysis, Transform theory, Data modeling, Optical filters, Image segmentation
SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONIMAGE-BASED METROLOGY
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1318908
TOPICS: Wavelets, Fringe analysis, Image filtering, Interferometry, Feature extraction, Optical filters, Image classification, Spatial light modulators, Filtering (signal processing), Image processing
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1316089
TOPICS: Edge detection, Signal to noise ratio, Detection and tracking algorithms, Signal processing, Machine vision, Pixel resolution, Image processing, Digital filtering, Sensors, Linear filtering
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329336
TOPICS: Fringe analysis, Shearography, Phase shifts, Speckle, Speckle pattern, Modulators, Video, Cameras, Polarization, Visibility
SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONSURFACE AND 3-D IMAGING
Mark Begbie, John Lesso, Wilson Sibbett, Miles Padgett
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1313241
TOPICS: Wave plates, Interferometry, Polarization, Ferroelectric LCDs, Liquid crystals, Computing systems, Modulators, Coherence (optics), Prisms, Phase shifts
Songtao Li, Dongming Zhao
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329339
TOPICS: 3D image processing, Sensors, Control systems, Image sensors, Optical spheres, Calibration, Data modeling, Image processing, 3D metrology, Imaging systems
SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONINDUSTRIAL APPLICATIONS
Anne-Claire Legrand, P. Suzeau, Eric Renier, Frederic Truchetet, Patrick Gorria, Fabrice Meriaudeau
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1314334
TOPICS: Machine vision, Laser processing, Image processing, Control systems, Temperature metrology, Cladding, Process control, Cameras, Signal processing, Image filtering
Richard Tidd, Joseph Wilder
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329338
TOPICS: Image segmentation, Cameras, Ocean optics, Light sources and illumination, Image processing, Classification systems, Water, Image processing algorithms and systems, Absorption, Binary data
SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONIMAGING ARCHITECTURES
Miguel Arias-Estrada, Cesar Torres-Huitzil
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329341
TOPICS: Image processing, Field programmable gate arrays, Computer architecture, Edge detection, Detection and tracking algorithms, Convolution, Machine vision, Computer vision technology, Corner detection, Clocks
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329334
TOPICS: Image processing, Binary data, Gaussian filters, Convolution, Linear filtering, Image filtering, Computer programming, Bandpass filters, Nonlinear filtering, Spatial frequencies
Olivier Huesser, Heinz Huegli
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1314335
TOPICS: Inspection, Optical inspection, Image analysis, Algorithms, Genetic algorithms, Distance measurement, Control systems, Optimization (mathematics), Machine learning, Imaging systems
Bruce Batchelor, Michael Daley, George Karantalis
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1329335
TOPICS: Cameras, Image processing, Java, Internet, Lamps, Machine vision, Light sources and illumination, Mirrors, Video, Prototyping
COMPRESSION AND CODING
Seong-Whan Kim, Shan Suthaharan, Heung-Kyu Lee, K. Rao
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1311794
TOPICS: Video, Image quality, Multimedia, Motion models, Eye, Forward error correction, Data compression, Visual communications, Eye models, Visualization
DIGITAL IMAGING PROCESSING
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1314621
TOPICS: Fractal analysis, Interference (communication), Synthetic aperture radar, Wavelets, Linear filtering, Image segmentation, Speckle, Image filtering, Image analysis, Wavelet transforms
DISPLAY DEVICES
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1335531
TOPICS: Holograms, Holography, Visualization, Java, 3D modeling, Computing systems, Stereo holograms, Computer programming, Optical design, Digital holography
MACHINE VISION
Shang-Hong Lai, Ming Fang
J. Electron. Imag. 10(1), (1 January 2001) https://doi.org/10.1117/1.1313240
TOPICS: Inspection, Reflectivity, Optical inspection, Image restoration, Computer aided design, Wavelets, Direct methods, Matrices, Manufacturing, Machine vision
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