1 January 2001 Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors
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J. of Electronic Imaging, 10(1), (2001). doi:10.1117/1.1318908
Abstract
The detection and classification of faults is a major task for optical nondestructive testing in industrial quality control. Interferometric fringes, obtained by real-time optical measurement methods, contain a large amount of image data with information about possible defect features. This mass of data must be reduced for further evaluation. One possible way is the filtering of these images by applying the adaptive wavelet transform, which has been proved to be a capable tool in the detection of structures with definite spatial resolution. In this paper we show the extraction and classification of disturbances in interferometric fringe patterns, the application of several wavelet functions with different parameters for the detection of faults, and the combination of wavelet filters for fault classification. Examples of fringe patterns of known and varying fault parameters are processed showing the trend of the extracted features in order to draw conclusions concerning the relation between the feature, the filter parameter, and the fault attributes. Real-time processing was achieved by importing video sequences in a hybrid optoelectronic system with digital image processing and an optical correlation module. The optical correlator system is based on liquidcrystal spatial light modulators, which are addressed with image and filter data. Results of digital simulation and optical realization are compared.
Sven Krueger, Guenther K.G. Wernicke, Wolfgang Osten, Daniel Kayser, Nazif Demoli, Hartmut Gruber, "Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors," Journal of Electronic Imaging 10(1), (1 January 2001). http://dx.doi.org/10.1117/1.1318908
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KEYWORDS
Wavelets

Fringe analysis

Image filtering

Feature extraction

Interferometry

Optical filters

Image classification

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