1 April 2003 Morphological characterization of dithering masks
Author Affiliations +
We present some novel tools for the analysis of blue-noise binary patterns. Unlike most of the existing methods that evaluate the frequency content of a given mask or its lower order statistics, our new metrics characterize the morphological content of a mask that is quantified using simple one-pass filtering. An analytical filter expression is given. As a result, one can balance the structural content of the mask—diagonal, vertical, and horizontal interconnections of the majority (or minority) pixels—at the same level. In addition, it is possible to improve the overall mask quality by prescribing the occurrence of morphological shapes of connected pixels. Examples of morphological analysis are given to demonstrate the different qualities of blue-noise and white-noise patterns.
© (2003) Society of Photo-Optical Instrumentation Engineers (SPIE)
Vladimir Misic, Vladimir Misic, Kevin J. Parker, Kevin J. Parker, } "Morphological characterization of dithering masks," Journal of Electronic Imaging 12(2), (1 April 2003). https://doi.org/10.1117/1.1556766 . Submission:


Autonomous visual discovery
Proceedings of SPIE (April 05 2000)
New methods for digital halftoning and inverse halftoning
Proceedings of SPIE (December 27 2001)
Bayesian anisotropic denoising in the Laguerre Gauss domain
Proceedings of SPIE (February 29 2008)

Back to Top