1 January 2006 Automatic inspection of pavement cracking distress
Author Affiliations +
J. of Electronic Imaging, 15(1), 013017 (2006). doi:10.1117/1.2177650
Abstract
We present an image processing algorithm customized for high-speed, real-time inspection of pavement cracking. In the algorithm, a pavement image is divided into grid cells of 8×8 pixels, and each cell is classified as a noncrack or crack cell using the grayscale information of the border pixels. Whether a crack cell can be regarded as a basic element (or seed) depends on its contrast to the neighboring cells. A number of crack seeds can be called a crack cluster if they fall on a linear string. A crack cluster corresponds to a dark strip in the original image that may or may not be a section of a real crack. Additional conditions to verify a crack cluster include the requirements in the contrast, width, and length of the strip. If verified crack clusters are oriented in similar directions, they will be joined to become one crack. Because many operations are performed on crack seeds rather than on the original image, crack detection can be executed simultaneously when the frame grabber is forming a new image, permitting real-time, online pavement surveys. The trial test results show a good repeatability and accuracy when multiple surveys were conducted at different driving conditions.
Yaxiong Huang, Bugao Xu, "Automatic inspection of pavement cracking distress," Journal of Electronic Imaging 15(1), 013017 (1 January 2006). http://dx.doi.org/10.1117/1.2177650
JOURNAL ARTICLE
6 PAGES


SHARE
KEYWORDS
Inspection

Image processing

Cameras

Light sources and illumination

Line scan image sensors

Frame grabbers

Imaging systems

RELATED CONTENT

OSCA an optimized stellar coronagraph for adaptive optics ...
Proceedings of SPIE (February 07 2003)
A High Resolution (5.7 Micron) Laser Film Printer
Proceedings of SPIE (November 27 1984)
Ten Years Of PACS Experience
Proceedings of SPIE (May 25 1989)

Back to Top