Journal of Electronic Imaging
VOL. 22 · NO. 1 | January 2013
JEI Letters
J. Electron. Imag. 22(1), 010501 (16 January 2013)
TOPICS: Glasses, Cameras, Control systems, Biometrics, Image enhancement, Prototyping, Video, Data acquisition, Imaging systems, Tablets
J. Electron. Imag. 22(1), 010502 (31 January 2013)
TOPICS: Algorithms, Data storage, Associative arrays, Image processing, Data conversion, Image storage, Imaging systems, Lithium, Information technology, Information science
Special Section on Mobile Computational Photography
J. Electron. Imag. 22(1), 010901 (21 February 2013)
TOPICS: Cameras, Computational imaging, Photography, Sensors, Cell phones, Wafer-level optics, Web 2.0 technologies, Visualization, Mobile devices, Sensor technology
J. Electron. Imag. 22(1), 011001 (31 January 2013)
TOPICS: Modulation transfer functions, Cameras, Sensors, Wafer-level optics, Image resolution, Manufacturing, Imaging systems, Image sensors, Reconstruction algorithms, Image segmentation
J. Electron. Imag. 22(1), 011002 (7 January 2013)
TOPICS: Image fusion, Reliability, Venus, Error analysis, Machine vision, Computer vision technology, Optimization (mathematics), Image segmentation, Fusion energy, Electronic imaging
J. Electron. Imag. 22(1), 011003 (4 February 2013)
TOPICS: Sensors, Cameras, Image sensors, Point spread functions, Deconvolution, Gyroscopes, Camera shutters, Photography, Image resolution, Motion models
J. Electron. Imag. 22(1), 011004 (31 January 2013)
TOPICS: Cameras, Calibration, Projection systems, Image quality, Distortion, 3D modeling, Visualization, Reflectivity, Image analysis, Fourier transforms
Regular Articles
J. Electron. Imag. 22(1), 013001 (3 January 2013)
TOPICS: Computer architecture, Machine vision, Image processing, Human-machine interfaces, Cameras, Sensors, Image acquisition, Data processing, Data modeling, Visual process modeling
J. Electron. Imag. 22(1), 013002 (3 January 2013)
TOPICS: Stars, Image registration, Image segmentation, Visualization, Image processing algorithms and systems, Image visualization, Feature extraction, Infrared imaging, Infrared radiation, Image processing
J. Electron. Imag. 22(1), 013003 (3 January 2013)
J. Electron. Imag. 22(1), 013004 (7 January 2013)
TOPICS: Cameras, Calibration, Lithium, Data centers, Distortion, Lenses, Algorithm development, 3D image processing, 3D modeling, Optimization (mathematics)
J. Electron. Imag. 22(1), 013005 (7 January 2013)
TOPICS: Image segmentation, Image processing algorithms and systems, Color image segmentation, Color image processing, Image processing, RGB color model, Image filtering, Databases, Optical filters, Image compression
J. Electron. Imag. 22(1), 013006 (7 January 2013)
TOPICS: Image restoration, Deconvolution, Signal to noise ratio, Image deconvolution, Image quality, Image analysis, Fourier transforms, Image processing, Convolution, Point spread functions
J. Electron. Imag. 22(1), 013007 (7 January 2013)
TOPICS: Video, Image processing, Visualization, Distortion, Mobile devices, Image quality, Video processing, Control systems, Detection and tracking algorithms, Computer simulations
J. Electron. Imag. 22(1), 013008 (9 January 2013)
TOPICS: Image processing, Visualization, Cryptography, Network security, Computer networks, Image analysis, Reconstruction algorithms, Fourier transforms, Image restoration, Electronic imaging
J. Electron. Imag. 22(1), 013009 (15 January 2013)
TOPICS: Graphene, Resistance, Temperature metrology, Carbon, Electrodes, Metals, Silicon, Semiconducting wafers, Environmental sensing, Raman spectroscopy
J. Electron. Imag. 22(1), 013010 (15 January 2013)
TOPICS: Magnetism, Reticles, Electron beam lithography, Lithography, Light sources, Semiconducting wafers, Extreme ultraviolet, Spin polarization, Deep ultraviolet, Metals
J. Electron. Imag. 22(1), 013011 (18 January 2013)
TOPICS: Prisms, Imaging systems, Lithography, Head, Control systems, Semiconducting wafers, Sapphire, Transducers, Silica, Scanning electron microscopy
J. Electron. Imag. 22(1), 013012 (22 January 2013)
TOPICS: Tin, Aluminum, Wafer bonding, Semiconducting wafers, Silicon, Scanning electron microscopy, Interfaces, Roads, Microelectromechanical systems, Nanolithography
J. Electron. Imag. 22(1), 013013 (23 January 2013)
TOPICS: Image enhancement, Resolution enhancement technologies, Image resolution, Satellite imaging, Earth observing sensors, Satellites, Image classification, Image denoising, Denoising, Image quality
J. Electron. Imag. 22(1), 013014 (6 February 2013)
TOPICS: Digital watermarking, Image quality, Sensors, Discrete wavelet transforms, Image processing, Image classification, Image filtering, Digital filtering, Signal to noise ratio, Fourier transforms
J. Electron. Imag. 22(1), 013015 (25 January 2013)
TOPICS: Detection and tracking algorithms, Binary data, Fourier transforms, Statistical modeling, Head, Surveillance, Wavelets, Distance measurement, Optical spheres, Electronic imaging
J. Electron. Imag. 22(1), 013016 (31 January 2013)
TOPICS: Image segmentation, Image retrieval, Feature extraction, Distance measurement, Image processing, Databases, Genetic algorithms, Computer programming, Binary data, Curium
J. Electron. Imag. 22(1), 013017 (1 February 2013)
TOPICS: Image encryption, 3D image processing, Photography, Diffusion, Image compression, Computer security, Chromium, Visualization, Raster graphics, Quantization
J. Electron. Imag. 22(1), 013018 (1 February 2013)
TOPICS: Databases, Detection and tracking algorithms, Principal component analysis, Error control coding, Facial recognition systems, Associative arrays, Image classification, Dimension reduction, Feature extraction, Light sources and illumination
J. Electron. Imag. 22(1), 013019 (1 February 2013)
TOPICS: Interference (communication), Databases, Image processing, Statistical analysis, Calibration, Sensors, Image analysis, CCD image sensors, Volume rendering, Cameras
J. Electron. Imag. 22(1), 013020 (31 January 2013)
TOPICS: Sensors, Image analysis, Edge detection, Error analysis, Algorithm development, Hough transforms, Cameras, Sensor performance, Statistical analysis, Electronic imaging
J. Electron. Imag. 22(1), 013021 (4 February 2013)
TOPICS: Image segmentation, Lithium, Motion models, Diffusion, Cognitive modeling, Visual process modeling, Tumors, Skin, Thermal modeling, Mathematical modeling
J. Electron. Imag. 22(1), 013022 (7 February 2013)
TOPICS: Expectation maximization algorithms, Data modeling, Chemical elements, 3D modeling, Image registration, Algorithms, Annealing, Algorithm development, Matrices, Distance measurement
J. Electron. Imag. 22(1), 013023 (8 February 2013)
TOPICS: Sensors, Edge detection, Image segmentation, Magnetic resonance imaging, Neptunium, Image filtering, Signal to noise ratio, Image processing, Interference (communication), Image denoising
J. Electron. Imag. 22(1), 013024 (11 February 2013)
TOPICS: Image processing, Image segmentation, Mammography, Scanners, Image quality, Digital mammography, Digital imaging, Computer aided diagnosis and therapy, Breast, Software development
J. Electron. Imag. 22(1), 013025 (13 February 2013)
TOPICS: Image encryption, Complex systems, Data communications, Computer security, Chaos, Algorithm development, Multimedia, Digital watermarking, Video, Cryptography
J. Electron. Imag. 22(1), 013026 (15 February 2013)
TOPICS: Image segmentation, Visualization, Remote sensing, Data modeling, Visual process modeling, Medical imaging, Statistical analysis, Statistical modeling, Associative arrays, Image processing algorithms and systems
J. Electron. Imag. 22(1), 013027 (19 February 2013)
TOPICS: Image enhancement, Image filtering, Smoothing, Nonlinear filtering, Algorithm development, Image processing, High dynamic range imaging, Control systems, Digital filtering, 3D image processing
J. Electron. Imag. 22(1), 013028 (26 February 2013)
TOPICS: Waveguides, Signal detection, Cameras, Stereoscopic cameras, 3D image processing, Sensors, Magnetism, Imaging systems, Distance measurement, Eye
J. Electron. Imag. 22(1), 013029 (28 February 2013)
TOPICS: Image quality, Reflectivity, Image segmentation, Gold, Colorimetry, Visualization, Digital imaging, Imaging systems, Visual system, Image visualization
J. Electron. Imag. 22(1), 013030 (1 March 2013)
TOPICS: Facial recognition systems, Near infrared, Detection and tracking algorithms, Head, Databases, Feature extraction, Image processing, Computing systems, Wavelet transforms, Machine vision
J. Electron. Imag. 22(1), 013031 (1 March 2013)
TOPICS: Eye, Detection and tracking algorithms, Video, Human-computer interaction, Iris recognition, Genetics, Image quality, Evolutionary algorithms, Feature extraction, Hough transforms
J. Electron. Imag. 22(1), 013032 (5 March 2013)
TOPICS: 3D displays, 3D image processing, Image quality, Visualization, Autostereoscopic displays, 3D vision, Eye, Imaging systems, 3D image enhancement, Image visualization
J. Electron. Imag. 22(1), 013033 (13 March 2013)
TOPICS: Image enhancement, Image segmentation, Image contrast enhancement, Image processing algorithms and systems, Medical imaging, Radiography, Digital imaging, Image processing, Iterated function systems, Image quality
J. Electron. Imag. 22(1), 013034 (19 March 2013)
TOPICS: Digital watermarking, Transform theory, Image quality, Visualization, Image analysis, Image processing, Computing systems, Visual analytics, Numerical stability, Quantization
J. Electron. Imag. 22(1), 013035 (27 March 2013)
TOPICS: Optical spheres, Light sources, Computer science, Light sources and illumination, Machine vision, Computer vision technology, 3D image processing, Visualization, Digital photography, 3D modeling
J. Electron. Imag. 22(1), 013036 (27 March 2013)
TOPICS: Image encryption, Chaos, Diffusion, Neural networks, Computer security, Evolutionary algorithms, Statistical analysis, Control systems, Network security, Associative arrays
J. Electron. Imag. 22(1), 013037 (1 April 2013)
TOPICS: Steganalysis, Sensors, Californium, Databases, Raster graphics, Image processing, Detection and tracking algorithms, Forensic science, Bandpass filters, Linear filtering
J. Electron. Imag. 22(1), 013038 (28 March 2013)
TOPICS: Optical flow, Neural networks, Diffusion, Evolutionary algorithms, Data modeling, Sun, Partial differential equations, Lithium, Image processing, Image analysis
Book Reviews
J. Electron. Imag. 22(1), 019901 (11 February 2013)
TOPICS: Super resolution, Imaging systems, Digital imaging, Image quality, Image enhancement, Algorithm development, Image registration, Digital mammography, Digital cameras, Image analysis
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