1 January 1994 Parallel mechanism for detecting contours in binary images
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J. of Electronic Imaging, 3(1), (1994). doi:10.1117/12.163971
Abstract
We present a parallel mechanism for detecting contours embedded in a binary image. The proposed algorithm can detect contours in parallel in sequential machines with less computational effort. The hardware architecture of the algorithm is also proposed. Experiments with a wide variety of binary images show that the speed of this new technique is much faster than that of other contour detection methods.
Kuo-Chin Fan, Chin-Chuan Han, "Parallel mechanism for detecting contours in binary images," Journal of Electronic Imaging 3(1), (1 January 1994). http://dx.doi.org/10.1117/12.163971
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KEYWORDS
Binary data

Image processing

Ytterbium

Data conversion

Fingerprint recognition

Detection and tracking algorithms

Feature extraction

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