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16 October 2017 Recent advances in edge illumination x-ray phase-contrast tomography
Anna Zamir, Charlotte Hagen, Paul C. Diemoz, Marco Endrizzi, Fabio Vittoria, Yujia Chen, Mark A. Anastasio, Alessandro Olivo
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Journal of Medical Imaging, Vol. 4, Issue 4, 040901 (October 2017). https://doi.org/10.1117/1.JMI.4.4.040901
Abstract
Edge illumination (EI) is an x-ray phase-contrast imaging technique, exploiting sensitivity to x-ray refraction to visualize features, which are often not detected by conventional absorption-based radiography. The method does not require a high degree of spatial coherence and is achromatic and, therefore, can be implemented with both synchrotron radiation and commercial x-ray tubes. Using different retrieval algorithms, information about an object’s attenuation, refraction, and scattering properties can be obtained. In recent years, a theoretical framework has been developed that enables EI computed tomography (CT) and, hence, three-dimensional imaging. This review provides a summary of these advances, covering the development of different image acquisition schemes, retrieval approaches, and applications. These developments constitute an integral part in the transformation of EI CT into a widely spread imaging tool for use in a range of fields.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
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Anna Zamir, Charlotte Hagen, Paul C. Diemoz, Marco Endrizzi, Fabio Vittoria, Yujia Chen, Mark A. Anastasio, and Alessandro Olivo "Recent advances in edge illumination x-ray phase-contrast tomography," Journal of Medical Imaging 4(4), 040901 (16 October 2017). https://doi.org/10.1117/1.JMI.4.4.040901
Received: 5 April 2017; Accepted: 21 September 2017; Published: 16 October 2017
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Cited by 18 scholarly publications.
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KEYWORDS
X-rays
Refraction
Signal attenuation
Tomography
Sensors
X-ray computed tomography
Synchrotron radiation
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