Open Access
2 August 2013 Periodic patterning using aerial image modulation with optical lithography
Boyan Penkov, Garry J. Bordonaro, Andrii B. Golovin, Igor Bendoym, Donald M. Tennant, David T. Crouse
Author Affiliations +
Abstract
Photolithography for patterns with periodicity in the illumination plane (2.5-D lithography) has seen rapid advances over the past decade, with the introduction of holographic lithography and the further development of phase-contrast and grayscale photolithography methods. However, each of these techniques suffers from substantial difficulties preventing further integration into device fabrication: a lack of parallel processing capabilities and dimension limitations. Here, we present a demonstration of controlled layer topography through modulation of both the exposure dose and exposure focal plane yielding reproducible 2.5-D patterns which are applied to the further development of plasmonic gratings. This process is entirely compatible with commercially available i -line photolithography and etch hardware, enabling a path to ready integration.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Boyan Penkov, Garry J. Bordonaro, Andrii B. Golovin, Igor Bendoym, Donald M. Tennant, and David T. Crouse "Periodic patterning using aerial image modulation with optical lithography," Journal of Micro/Nanolithography, MEMS, and MOEMS 12(3), 033009 (2 August 2013). https://doi.org/10.1117/1.JMM.12.3.033009
Published: 2 August 2013
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Optical lithography

Photoresist materials

Modulation

Etching

Lithography

Photomasks

Semiconducting wafers


CHORUS Article. This article was made freely available starting 02 August 2014

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