1 January 2011 Spectroscopic ellipsometry of few-layer graphene
Author Affiliations +
J. of Nanophotonics, 5(1), 051809 (2011). doi:10.1117/1.3598162
The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-μm nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be ±10%.
© 2011 Society of Photo-Optical Instrumentation Engineers (SPIE)
Goran Isic, Milka Jakovljevic, Marko Filipovic, Djordje M. Jovanovic, Borislav Vasic, Sasa Lazovic, Nevena Puac, Zoran Lj. Petrovic, Radmila Kostic, Rados Gajic, Josef Humlicek, Maria Losurdo, Giovanni Bruno, Iris Bergmair, Kurt Hingerl, "Spectroscopic ellipsometry of few-layer graphene," Journal of Nanophotonics 5(1), 051809 (1 January 2011). https://doi.org/10.1117/1.3598162


Atomic force microscopy

Spectroscopic ellipsometry

Data modeling

Refractive index

Optical properties

Raman spectroscopy

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