27 November 2012 Time-of-flight studies of hole mobilities in DNA-CTMA films fabricated and passivated in a dry environment
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Abstract
Salmon DNA-based films, including as-received DNA (molecular weight, MW > 2000 kDa) and sonicated DNA of MW ~200 kDa, both complexed with hexacetyltrimethyl-ammonium chloride (CTMA) surfactant, were studied. The DNA solutions were spin-coated on indium tin oxide (ITO)-coated quartz slides with vacuum deposited gold charge-collecting electrodes. The films were fabricated entirely at ~0% humidity (0 to 86 ppmv of water) in a nitrogen-purged glove box and coated with 500 to 600 nm passivating layers of conformal urethane before exposure to room air. A quadrupled, 20 ns pulsed Nd:YAG laser with output at 266 nm was used for charge injection. The room temperature photoconductive transients were dispersive with hole mobilities in DNA films ranging between 7E-3 to 5Ε-5 cm2 / Vs for fields ranging from 10 to 380 kV / cm. No electron response was observed in these films. The mobilities were determined from the transient curves at the intersections of initial and final tangent lines that defined the shoulders in the log-log plots. The results of these hole mobility studies, which appear to support predictions of high hole mobility in DNA, are the first on DNA-based films that were fabricated in a dry environment and passivated for measurements in room air.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE)
Perry P. Yaney, Timothy T. Gorman, Fahima Ouchen, James G. Grote, "Time-of-flight studies of hole mobilities in DNA-CTMA films fabricated and passivated in a dry environment," Journal of Nanophotonics 6(1), 063531 (27 November 2012). https://doi.org/10.1117/1.JNP.6.063531 . Submission:
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