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11 September 2013 Confocal laser scanning microscopy measurement of the morphology of vanadium pentoxide nanorods grown by electron beam irradiation or thermal oxidation
Manil Kang, Donghyuk Hong, Taesung Kim, Minwoo Chu, Sok Won Kim
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Journal of Nanophotonics, Vol. 7, Issue 1, 073797 (September 2013). https://doi.org/10.1117/1.JNP.7.073797
Abstract
In order to observe the morphology of nanostructures at the submicroscale, we use a confocal laser scanning (CLS) microscope built in our laboratory. The theoretical resolution of the hand-made CLS microscope is 150 nm and the performance of the microscope is evaluated by observing a USAF target. Vanadium pentoxide nanorods grown by electron beam irradiation and thermal oxidation methods are used as nanostructures and the morphologies of the nanorods observed by confocal laser scanning microscopy (CLSM) are compared with those obtained by scanning electron microscopy. The magnification and resolution of the CLSM were estimated to be approximately 1500 and 800 nm, respectively. From the results, we confirm that the CLSM can be used to measure nanostructures at the sub-micro-scale without a preconditioning process.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
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Manil Kang, Donghyuk Hong, Taesung Kim, Minwoo Chu, and Sok Won Kim "Confocal laser scanning microscopy measurement of the morphology of vanadium pentoxide nanorods grown by electron beam irradiation or thermal oxidation," Journal of Nanophotonics 7(1), 073797 (11 September 2013). https://doi.org/10.1117/1.JNP.7.073797
Published: 11 September 2013
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Cited by 2 scholarly publications.
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KEYWORDS
Vanadium
Nanorods
Microscopes
Scanning electron microscopy
Electron beams
Thermal oxidation
Confocal laser scanning microscopy
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