30 August 2013 Optical determination of thick graphene layer number based on surface plasmon resonance
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Abstract
An optical method of measuring the number of layers in a graphene sample is formulated and compared with the conventional surface plasmon resonance (SPR) detection scheme, the latter being appropriate only for a very few graphene layers. Numerical results based on transfer-matrix method support that an alternative method, wherein the SPR substrate includes a dielectric overlayer, is feasible over a wide range of graphene layer numbers. While the multilayer graphene may lead to a broad and shallow SPR curve owing to the nonzero imaginary part in its relative permittivity, the dielectric overlayer makes the resonant surface plasmons less affected by graphene, resulting in a strong and deep absorption band at resonance. Linear regression analysis shows that the measurable graphene layer number can be as high as 50.
© 2013 Society of Photo-Optical Instrumentation Engineers (SPIE)
Sherif H. ElGohary, Sherif H. ElGohary, Nak-Hyeon Kim, Nak-Hyeon Kim, Kyung Min Byun, Kyung Min Byun, } "Optical determination of thick graphene layer number based on surface plasmon resonance," Journal of Nanophotonics 7(1), 073799 (30 August 2013). https://doi.org/10.1117/1.JNP.7.073799 . Submission:
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