14 February 2014 Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry
Author Affiliations +
J. of Nanophotonics, 8(1), 089999 (2014). doi:10.1117/1.JNP.8.089999
Abstract
This article [J. Nanophoton.. 8, (1 ), 083890 ( Feb 5 , 2014)] mistakenly appeared in the Special Section on Metamaterials and Photonic Nanostructures. It was republished in the Special Section on Nanostructured Thin Films VI with a corrected CID on 10 February 2014. The updated citation is shown below:
Jones, Sun, Murphy, Back, Lange, Remmert, Terrence Murray, and Jakubiak: Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry

This article [J. Nanophoton. 8(1), 083890 (Feb 5, 2014)] mistakenly appeared in the Special Section on Metamaterials and Photonic Nanostructures. It was republished in the Special Section on Nanostructured Thin Films VI with a corrected CID on 10 February 2014. The updated citation is shown below:

J. G. Joneset al., “Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry,” J. Nanophoton. 8, 083999 (2014).

John G. Jones, Lirong Sun, Neil R. Murphy, Tyson C. Back, Matthew A. Lange, Jessica L. Remmert, Paul T. Murray, "Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry," Journal of Nanophotonics 8(1), 089999 (14 February 2014). http://dx.doi.org/10.1117/1.JNP.8.089999
JOURNAL ARTICLE
2 PAGES


SHARE
KEYWORDS
Ellipsometry

Pulsed laser deposition

Thin films

Nanostructured thin films

Photonic nanostructures

Metamaterials

Roads

Back to Top