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1 July 1990 X-ray measurements of total reflectivity and scattering from Au-coated foils
Allan Hornstrup, Finn Erland Christensen, Ellen Jespersen, U. Henriksen, Herbert W. Schnopper
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Optical Engineering, Vol. 29, Issue 7, (July 1990). https://doi.org/10.1117/12.153815
We present x-ray measurements of total reflectivity and scattering from gold-coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data shows a high reflectivity for all but the plastic foil, and only small microroughness (~15 Å at length scales below ~0.1 µm), evidenced by low resolution scattering measurements.
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Allan Hornstrup, Finn Erland Christensen, Ellen Jespersen, U. Henriksen, and Herbert W. Schnopper "X-ray measurements of total reflectivity and scattering from Au-coated foils," Optical Engineering 29(7), (1 July 1990). https://doi.org/10.1117/12.153815
Published: 1 July 1990
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KEYWORDS
Reflectivity
Scattering
X-rays
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