1 May 1991 Reflective fiber optic temperature sensor using silicon thin film
John W. Berthold III, Stuart E. Reed, Randall G. Sarkis
Author Affiliations +
Abstract
We have characterized the performance of a series of fiber optic intensity sensors for temperature measurement. The method measures the change in absorption with temperature of light reflected from a thin silicon film deposited on the end of an optical fiber. Our single-ended sensing approach requires that the incident light intensity be reflected from both film surfaces and that these reflected signals reenter the fiber. Sensors fabricated with simplified methods have been shown to yield sensitivity comparable to that reported by other authors. Calibration data on sensors with different silicon film thicknesses are presented up to 400°C. Potential applications of the method are discussed.
John W. Berthold III, Stuart E. Reed, and Randall G. Sarkis "Reflective fiber optic temperature sensor using silicon thin film," Optical Engineering 30(5), (1 May 1991). https://doi.org/10.1117/12.55838
Published: 1 May 1991
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CITATIONS
Cited by 10 scholarly publications and 4 patents.
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KEYWORDS
Silicon films

Fiber optics sensors

Sensors

Temperature metrology

Fiber optics

Light emitting diodes

Silicon

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