Strain microscope with grating diffraction method

Bing Zhao; Anand Krishna Asundi

doi:10.1117/1.602072

1 January 1999 Strain microscope with grating diffraction method

Bing Zhao, Anand Krishna Asundi

Optical Engineering, Vol. 38, Issue 1, (January 1999). https://doi.org/10.1117/1.602072

A compact microscope system for direct strain measurement is presented. it involves the grating diffraction method coupled with microscopy and image-processing technique. A Leitz optical transmitting microscope with white light source was rebuilt to incorporate a loading and recording system. Gratings with median density from 40 to 200 lines/mm are used. with the help of a Bertrand lens, the Fourier spectrum of the grating is formed on the CCD sensor plane with high image quality. Software that can precisely, quickly, and automatically determine the diffraction spot centroids has been developed. The local strain is measured with high resolution. Various ways of improving the sensitivity are suggested.

Citation Download Citation

Bing Zhao and Anand Krishna Asundi "Strain microscope with grating diffraction method," Optical Engineering 38(1), (1 January 1999). https://doi.org/10.1117/1.602072

Published: 1 January 1999

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available