Influence of non-uniform charge-coupled device pixel response on aperture photometry

Daniel Kavaldjiev; Zoran Ninkov

doi:10.1117/1.1339199

1 February 2001 Influence of non-uniform charge-coupled device pixel response on aperture photometry

Daniel Kavaldjiev, Zoran Ninkov

Optical Engineering, Vol. 40, Issue 2, (February 2001). https://doi.org/10.1117/1.1339199

The extensive use of charge-coupled devices (CCDs) in astronomical imaging and spectroscopic applications has resulted in techniques being developed to correct for sensitivity variations attributable to the focal plane array detector. One normally overlooked effect is that these sensitivity variations also include intrapixel spatial effects that can influence measurements made with CCDs in certain circumstances. We demonstrate the influence of CCD pixel response nonuniformity on photometric measurements. An investigation is presented of how the relation between pixel size and the image size affects the photometric accuracy. Results are presented for a front-illuminated CCD array using an experimentally measured pixel sensitivity functions.

©(2001) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Daniel Kavaldjiev and Zoran Ninkov "Influence of non-uniform charge-coupled device pixel response on aperture photometry," Optical Engineering 40(2), (1 February 2001). https://doi.org/10.1117/1.1339199

Published: 1 February 2001

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