Quantitative measurement for the modulation of photorefractive index gratings

Shoang C. Donn; Chung-Chen Tu; Ching-Cherng Sun; Ming-Tsung Chen

doi:10.1117/1.1476941

1 June 2002 Quantitative measurement for the modulation of photorefractive index gratings

Shoang C. Donn, Chung-Chen Tu, Ching-Cherng Sun, Ming-Tsung Chen

Optical Engineering, Vol. 41, Issue 6, (June 2002). https://doi.org/10.1117/1.1476941

The modulation of a photorefractive index grating, ?n, can be estimated by counting the number of peaks in the curve for the diffraction efficiency as a function of time under the phase matching condition. The accuracy for this method is about 13%. Here a new method is proposed, in which we improve the measurement accuracy to about 1%, by adding the measurement for the diffraction efficiency as a function of the angle mismatch. This precise ?n measurement allows us to quantify photorefractive effects with greater accuracy.

©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Shoang C. Donn, Chung-Chen Tu, Ching-Cherng Sun, and Ming-Tsung Chen "Quantitative measurement for the modulation of photorefractive index gratings," Optical Engineering 41(6), (1 June 2002). https://doi.org/10.1117/1.1476941

Published: 1 June 2002

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