Scaled topometry in a multisensor approach

Daniel Kayser; Thorsten Bothe; Wolfgang Osten

doi:10.1117/1.1788690

1 October 2004 Scaled topometry in a multisensor approach

Daniel Kayser, Thorsten Bothe, Wolfgang Osten

Author Affiliations +

Optical Engineering, Vol. 43, Issue 10, (October 2004). https://doi.org/10.1117/1.1788690

Abstract

Reliable real-time surface inspection of extended surfaces with high resolution is needed in several industrial applications. With respect to an efficient application to extended technical components such as aircraft or automotive parts, the inspection system has to perform a robust measurement with a ratio between depth resolution and lateral extension of less than 10^–6. This ratio is at least 1 order beyond the solutions that are offered by existing technologies. The concept of scaled topometry consists of a systematic combination of different optical measurement techniques with overlapping ranges of resolution systematically to receive characteristic surface information with the required accuracy. In such a surface inspection system, an active algorithm combines measurements on several scales of resolution and distinguishes between local fault-indicating structures with different extensions and global geometric properties. The first part of this active algorithm finds indications of critical surface areas in the data of every measurement and separates them into different categories. The second part analyzes the detected structures in the data with respect to their resolution, and decides whether a further local measurement with a higher resolution has to be performed. The third part positions the sensors and starts the refined measurements. The fourth part finally integrates the measured local dataset into the overall data mesh. We have constructed a laboratory setup capable of measuring surfaces with extensions up to 1500×1000×500 mm³ (in x, y, and z directions, respectively). Using this measurement system we are able to separate the fault-indicating structures on the surface from the global shape, and to classify the detected structures according to their extensions and characteristic shapes simultaneously. The level of fault-detection probability is applicable by input parameter control.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Daniel Kayser, Thorsten Bothe, and Wolfgang Osten "Scaled topometry in a multisensor approach," Optical Engineering 43(10), (1 October 2004). https://doi.org/10.1117/1.1788690

Published: 1 October 2004

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available