1 March 2007 Whole-field optical strain sensor using a microlens array
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Abstract
We discuss a novel whole-field optical strain sensor termed the moiré interferometric strain sensor (MISS) for simultaneous measuring of multipoint strains and whole-field contours of in-plane displacement. A high-frequency grating, attached to the surface of a specimen, is used as the displacement and strain-sensing unit. When illuminated by two collimated beams at a prescribed angle, the interference of the diffracted beams gives the whole-field deformation contours. If, on the other hand, each of the individual beams is separately imaged using a multilens CCD sensor similar to a wavefront sensor, the separation between the spot centroids for each microlens is directly proportional to the normal or shear strain component at the corresponding position on the specimen. Applications are demonstrated for uniform rotation and simulated in-plane strains.
©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)
Anand Krishna Asundi, Jun Wang, Anish Priyadarshi, Wei Zhou, Subodh G. Mhaisalkar, and Lennie E. N. Lim "Whole-field optical strain sensor using a microlens array," Optical Engineering 46(3), 034403 (1 March 2007). https://doi.org/10.1117/1.2716372
Published: 1 March 2007
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CITATIONS
Cited by 9 scholarly publications.
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KEYWORDS
Sensors

Diffraction gratings

Diffraction

Microlens array

Wavefront sensors

Interferometry

CCD image sensors

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