Almost-common path interferometer using the separation of polarization states for digital phase-shifting shearography

Vanessa Rosso; Yvon L. M. Renotte; Serge L. Habraken; Yves F. Lion; Fabrice R. Michel; Vincent Moreau; Bernard Tilkens

doi:10.1117/1.2795632

1 October 2007 Almost-common path interferometer using the separation of polarization states for digital phase-shifting shearography

Vanessa Rosso, Yvon L. M. Renotte, Serge L. Habraken, Yves F. Lion, Fabrice R. Michel, Vincent Moreau, Bernard Tilkens

Author Affiliations +

Optical Engineering, Vol. 46, Issue 10, 105601 (October 2007). https://doi.org/10.1117/1.2795632

Abstract

An original experimental setup for shearography with metrological applications is presented. The simplicity and the efficiency of the setup are provided by a shearing device, a prism that separates the TE and TM polarization modes with a coating and a thin glass plate placed on its face. The use of this shearing device enables an in-line and almost-common path configuration for the shearing interferometer, a path that leads to high stability and a low sensitivity to external disturbances. Moreover, the sensitivity of the interferometer can be easily adjusted for different applications by varying the shearing amount with glass plates of different thicknesses or by moving the shearing device between two lenses along the optical axis. The temporal phase-shifting method is applied through the use of a liquid crystal variable retarder.

©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Vanessa Rosso, Yvon L. M. Renotte, Serge L. Habraken, Yves F. Lion, Fabrice R. Michel, Vincent Moreau, and Bernard Tilkens "Almost-common path interferometer using the separation of polarization states for digital phase-shifting shearography," Optical Engineering 46(10), 105601 (1 October 2007). https://doi.org/10.1117/1.2795632

Published: 1 October 2007

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