1 October 2010 Novel metric of relative characteristics of small targets and backgrounds in infrared images
Kang Huang, Xia Mao
Author Affiliations +
Abstract
Small targets in infrared images are usually detected by using the relative characteristics of small targets and backgrounds. Compared with conventional descriptors, detectability of infrared small targets (DIST) is a better metric of the relative characteristics of small targets and backgrounds. However, the quantification method of DIST cannot describe the situation of darker targets in brighter background, which is common due to the intense reflection of sunlight. Moreover, its value is not normalized, so that it is not well suited to evaluate the degree of difference between small targets and backgrounds. An improved quantification method of DIST is proposed to address these problems, and a detecting method is developed based on the improved DIST. The experimental results show the validity of the improved quantification approach of DIST.
©(2010) Society of Photo-Optical Instrumentation Engineers (SPIE)
Kang Huang and Xia Mao "Novel metric of relative characteristics of small targets and backgrounds in infrared images," Optical Engineering 49(10), 103202 (1 October 2010). https://doi.org/10.1117/1.3497568
Published: 1 October 2010
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Target detection

Infrared imaging

Infrared radiation

Infrared detectors

Detection and tracking algorithms

Optical engineering

Monte Carlo methods

Back to Top