High-throughput and multislit imaging spectrograph for extended sources

Supriya Chakrabarti; Olli-Pekka Jokiaho; Jeffrey L. Baumgardner; Timothy A. Cook; Jason Martel; Marina Galand

doi:10.1117/1.OE.51.1.013003

1 February 2012 High-throughput and multislit imaging spectrograph for extended sources

Supriya Chakrabarti, Olli-Pekka Jokiaho, Jeffrey L. Baumgardner, Timothy A. Cook, Jason Martel, Marina Galand

Author Affiliations +

Optical Engineering, Vol. 51, Issue 1, 013003 (February 2012). https://doi.org/10.1117/1.OE.51.1.013003

Abstract

We describe a high-throughput (5×10^-4cm² sr) imaging spectrograph that uses an echelle grating operating at a high dispersion order (24 to 43) to observe extended sources such as atmospheric airglow and diffuse proton aurora at high spectral resolution (approximately 0.02 nm). Instead of using a traditional single slit, the implementation of the instrument described here uses four (50 µm × 25 mm) slits through which the radiation enters the spectrograph. The field of view is selected using appropriate foreoptics: the present implementation is a long, narrow configuration of 0.1 × 50 deg. By placing interference filters in the beam path, the instrument can simultaneously observe several spectral features located anywhere in the visible band (approximately 300 to 1000 nm) at high resolution. This design allows a single echelle grating and a single detector (a CCD in the present implementation) to view the same scene. The design is flexible; the number of slits and the slit dimensions can be tailored to the trade-offs between resolution, throughput, and number of spectral features depending upon the measurement need. While the implementation described here covers only the visible range, the use of different combinations of detector and filter sets can extend its operation to other wavelength regions.

Citation Download Citation

Supriya Chakrabarti, Olli-Pekka Jokiaho, Jeffrey L. Baumgardner, Timothy A. Cook, Jason Martel, and Marina Galand "High-throughput and multislit imaging spectrograph for extended sources," Optical Engineering 51(1), 013003 (1 February 2012). https://doi.org/10.1117/1.OE.51.1.013003

Published: 1 February 2012

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available