Influence of error sources in speckle interferometry using only two speckle patterns

Yasuhiko Arai

doi:10.1117/1.OE.55.12.124101

14 December 2016 Influence of error sources in speckle interferometry using only two speckle patterns

Yasuhiko Arai

Author Affiliations +

Optical Engineering, Vol. 55, Issue 12, 124101 (December 2016). https://doi.org/10.1117/1.OE.55.12.124101

Abstract

Speckle interferometry is an important deformation measurement method for objects with rough surfaces. Recently, a fringe analysis method that uses only one speckle pattern before deformation and one after deformation was proposed. The measurement accuracy of this method is known to depend on experimental conditions. In this paper, the improvement of the measurement accuracy of this method is discussed in comparison with the advanced technologies of off-axis digital holography. It is highly effective to introduce the experiences of the advanced technologies of digital holography to speckle interferometry. However, it should also be considered that both technologies have different purposes. Because digital holography is basically a technology which records images, the influence of the quantity of deformation has never been discussed in digital holography in detail. In this study, the measurement accuracy of speckle interferometry is investigated through a precise comparison of the experimental results from both technologies. It was confirmed that the conditions for digital holography are not always suitable for improving the measurement accuracy of speckle interferometry.

Citation Download Citation

Yasuhiko Arai "Influence of error sources in speckle interferometry using only two speckle patterns," Optical Engineering 55(12), 124101 (14 December 2016). https://doi.org/10.1117/1.OE.55.12.124101

Published: 14 December 2016

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