Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

David C. Look; Kevin D. Leedy; Arnold Kiefer; Bruce B. Claflin; Naho Itagaki; Koichi Matsushima; Iping Suhariadi

doi:10.1117/1.OE.56.4.049801

4 April 2017 Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

David C. Look, Kevin D. Leedy, Arnold Kiefer, Bruce B. Claflin, Naho Itagaki, Koichi Matsushima, Iping Suhariadi

Author Affiliations +

Optical Engineering, Vol. 56, Issue 4, 049801 (April 2017). https://doi.org/10.1117/1.OE.56.4.049801

This article [Opt. Eng. 52(3), 033801 (2013)] was originally published on 13 March 2013 with an error in the author list. The last author’s name was misspelled “Surhariadi.” The correct spelling appears above. The paper was corrected on 23 March 2017.

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David C. Look, Kevin D. Leedy, Arnold Kiefer, Bruce B. Claflin, Naho Itagaki, Koichi Matsushima, and Iping Suhariadi "Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide," Optical Engineering 56(4), 049801 (4 April 2017). https://doi.org/10.1117/1.OE.56.4.049801

Published: 4 April 2017

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