Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement

Xinya Gao; Yonghong Wang; Junrui Li; Xizuo Dan; Sijin Wu; Lianxiang Yang

doi:10.1117/1.OE.56.6.066107

15 June 2017 Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement

Xinya Gao, Yonghong Wang, Junrui Li, Xizuo Dan, Sijin Wu, Lianxiang Yang

Author Affiliations +

Optical Engineering, Vol. 56, Issue 6, 066107 (June 2017). https://doi.org/10.1117/1.OE.56.6.066107

Abstract

It is difficult to measure absolute three-dimensional deformation using traditional digital speckle pattern interferometry (DSPI) when the boundary condition of an object being tested is not exactly given. In practical applications, the boundary condition cannot always be specifically provided, limiting the use of DSPI in real-world applications. To tackle this problem, a DSPI system that is integrated by the spatial carrier method and a color camera has been established. Four phase maps are obtained simultaneously by spatial carrier color-digital speckle pattern interferometry using four speckle interferometers with different illumination directions. One out-of-plane and two in-plane absolute deformations can be acquired simultaneously without knowing the boundary conditions using the absolute deformation extraction algorithm based on four phase maps. Finally, the system is proved by experimental results through measurement of the deformation of a flat aluminum plate with a groove.

Citation Download Citation

Xinya Gao, Yonghong Wang, Junrui Li, Xizuo Dan, Sijin Wu, and Lianxiang Yang "Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement," Optical Engineering 56(6), 066107 (15 June 2017). https://doi.org/10.1117/1.OE.56.6.066107

Received: 7 March 2017; Accepted: 22 May 2017; Published: 15 June 2017

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