1 June 1977 Techniques for Evaluating Charge Coupled Imagers
S. B. Campana
Author Affiliations +
Abstract
Charge coupled imagers present special problems not encountered with beam-scanned sensors. This paper describes some of the instrumentation, procedures, and analyses used to evaluate charge coupled imagers. A simple analog technique for extracting signals from noise is discussed. Techniques are given for measuring and interpreting MTF (modulation transfer function), limiting resolution, temporal and spatial noise, image spreading, and image lag. Effects peculiar to CCDs (charge coupled devices) and CIDs (charge injection devices), such as aliasing and image smearing, are discussed.
S. B. Campana "Techniques for Evaluating Charge Coupled Imagers," Optical Engineering 16(3), 163267 (1 June 1977). https://doi.org/10.1117/12.7972143
Published: 1 June 1977
Lens.org Logo
CITATIONS
Cited by 14 scholarly publications and 6 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Imaging systems

Charge-coupled devices

Modulation transfer functions

Analog electronics

Image resolution

Interference (communication)

Sensors

RELATED CONTENT

On noise in time-delay integration CMOS image sensors
Proceedings of SPIE (May 13 2016)
Development of the micro-CT system for small animal
Proceedings of SPIE (September 16 2005)
Research of range resolution of streak tube imaging system
Proceedings of SPIE (January 11 2007)
Aliasing phenomenon in EBCCD imaging
Proceedings of SPIE (August 30 2002)
Scanned Projection Radiography With A Slot Beam
Proceedings of SPIE (June 27 1988)
THX 7887A a new high frame rate 1024 x...
Proceedings of SPIE (October 14 1994)

Back to Top