This paper attempts an analytical treatment of flare light in microdensitometers by developing a model based on scattering from the air-glass interface. Verification of the model is conducted via a breadboard mockup on an optical table, and on an actual microdensitometer. It is, seen that the simple model predicts values for flare irradiance well within an order of magnitude. It is further shown that a sample trace is not only a convolution of the target with the projected sensor aperture but, to some extent, a convolution of the target with the irradiated area in the sample plane as well. Based on this analysis, it is shown that flare can be corrected for provided its magnitude is held constant. This requires that, during a full scan, the target always remains effectively within the irradiated area.