1 February 1978 The Selective Modulation Interferometric Spectrometer
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Abstract
This paper reviews the theory and the practical implementation of the selective modulation interferometric spectrometer (the SIMS). This spectrometer has an extremely large optical throughput, and it can scan the spectrum in real time while requiring no more signal processing than a chopped radiometer. Equations are presented which describe the relationship between design parameters and spectrometer performance. Practical design problems are identified, and some solutions to these problems are given.
Roy W. Esplin, Roy W. Esplin, } "The Selective Modulation Interferometric Spectrometer," Optical Engineering 17(1), 170173 (1 February 1978). https://doi.org/10.1117/12.7972182 . Submission:
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