1 August 1979 Selective Modulation Interferometric Spectrometer (SIMS) Technique Applied To Background Suppression
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Abstract
A method of using the SIMS (the Selective Modulation Interferometric Spectrometer) to measure the difference between the spectral content of two optical beams is given. The differencing is done optically; that is, the modulated detector signal is directly proportional to the difference between the two spectra being compared. This optical differencing minimizes the dynamic-range requirements of the electronics and requires only a simple modification of the basic cyclic SIMS spectrometer. This technique can be used to suppress background radiation for the enhancement of target detection and tracking. Laboratory measurements demonstrating the application of this technique are reported.
George A. Vanasse, Roy W. Esplin, Ronald J. Huppi, "Selective Modulation Interferometric Spectrometer (SIMS) Technique Applied To Background Suppression," Optical Engineering 18(4), 184403 (1 August 1979). https://doi.org/10.1117/12.7972395 . Submission:
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