1 October 1980 Photoconductor-Thermoplastic Devices For Holographic Nondestructive Testing
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Optical Engineering, 19(5), 195659 (1980). doi:10.1117/12.7972585
Although photoconductor-thermoplastic devices have been considered for holographic applications in the past, they suffered from limited recording bandwidth and poor noise characteristics; as a consequence, they were confined to recording holograms of relatively small objects. In this paper techniques for improving the spatial bandwidth to 1500 lines/mm are described. Furthermore, the frost formation mechanism was investigated, and means for suppressing the frost were determined, thereby leading to improved signal-to-noise ratios. These results, together with high exposure sensitivity (50 ergs/cm2) and the improvement in sample fabrication, have led to an operable device which may be incorporated into most holographic nondestructive systems.
A. A. Friesem, Y. Katzir, Z. Rav-Noy, B. Sharon, "Photoconductor-Thermoplastic Devices For Holographic Nondestructive Testing," Optical Engineering 19(5), 195659 (1 October 1980). https://doi.org/10.1117/12.7972585

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