1 October 1980 Photoconductor-Thermoplastic Devices For Holographic Nondestructive Testing
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Abstract
Although photoconductor-thermoplastic devices have been considered for holographic applications in the past, they suffered from limited recording bandwidth and poor noise characteristics; as a consequence, they were confined to recording holograms of relatively small objects. In this paper techniques for improving the spatial bandwidth to 1500 lines/mm are described. Furthermore, the frost formation mechanism was investigated, and means for suppressing the frost were determined, thereby leading to improved signal-to-noise ratios. These results, together with high exposure sensitivity (50 ergs/cm2) and the improvement in sample fabrication, have led to an operable device which may be incorporated into most holographic nondestructive systems.
A. A. Friesem, A. A. Friesem, Y. Katzir, Y. Katzir, Z. Rav-Noy, Z. Rav-Noy, B. Sharon, B. Sharon, } "Photoconductor-Thermoplastic Devices For Holographic Nondestructive Testing," Optical Engineering 19(5), 195659 (1 October 1980). https://doi.org/10.1117/12.7972585 . Submission:
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