1 December 1980 Double-Beam Interferometers For Analysis Of Thin Films
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Abstract
Three recently developed methods are described and their capabilities discussed. Each of these methods is applicable for the accurate determination of the thickness, refractive index and absorption of thin films.
Joseph Shamir, "Double-Beam Interferometers For Analysis Of Thin Films," Optical Engineering 19(6), 196801 (1 December 1980). https://doi.org/10.1117/12.7972614 . Submission:
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