1 June 1982 Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements
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Abstract
Electronic speckle pattern interferometry (ESPI) enables static and dynamic surface displacements to be measured in real time to an accuracy of the order of a wavelength of light. The principles of the technique are outlined and the different configurations of interferometers described. Some applications of the technique are discussed.
Catherine Wykes, "Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements," Optical Engineering 21(3), 213400 (1 June 1982). https://doi.org/10.1117/12.7972922 . Submission:
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