1 December 1982 New Absolute Reflectometer
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Abstract
An instrument has been developed for measuring absolute reflectance at near normal incidence in the infrared region of the spectrum. The basic design of the instrument is similar to the Bennett absolute reflectometer except for some differences in implementation. The major sources of systematic errors have been reduced or eliminated. The alignment procedure is described.
K. AI-Marzouk, K. AI-Marzouk, M. Jacobson, M. Jacobson, R. Parks, R. Parks, M. Rodgers, M. Rodgers, } "New Absolute Reflectometer," Optical Engineering 21(6), 216976 (1 December 1982). https://doi.org/10.1117/12.7973017 . Submission:
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