1 December 1982 Cavity Phase Shift Method For High Reflectance Measurements At Mid-Infrared Wavelengths
Author Affiliations +
Abstract
The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9 micrometers wavelength is described. A reflectance of 0.9920±0.0050 has been measured.
Munson A. Kwok, Munson A. Kwok, John M. Herbelin, John M. Herbelin, Robert H. Ueunten, Robert H. Ueunten, } "Cavity Phase Shift Method For High Reflectance Measurements At Mid-Infrared Wavelengths," Optical Engineering 21(6), 216979 (1 December 1982). https://doi.org/10.1117/12.7973018 . Submission:
JOURNAL ARTICLE
4 PAGES


SHARE
Back to Top