1 June 1985 Surface Metrology
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Abstract
Eric Schneider, a very good friend and colleague, passed away on July 31 of last year at the age of 73. He had many technical interests, but one of his passions was surface metrology. Eric was born and educated in Vienna and earned a doctorate in law at the University of Vienna. He came to the United States in 1939 and became cofounder and later president of the En is Equipment Company, where his interests in dimensional metrology, d'iamondl finishing, and surface texture resulted in a number of publications and patents.
Theodore Vorburger, "Surface Metrology," Optical Engineering 24(3), 243371 (1 June 1985). https://doi.org/10.1117/12.7973491 . Submission:
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