1 November 1986 Performance Of A Layered Synthetic Microstructure Spectrogoniometer For Characteristic X-Ray Lines
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Abstract
A spectrogoniometer designed to measure the quality of x-ray and XUV dispersive devices is described. The reflectivity of layered synthetic microstructures (LSMs) is presented at three wavelengths (13.3 A, 44.8 A, 67.7 A), corresponding to the emission lines of Cu, C, and B, respectively, emitted from a windowless x-ray tube. In particular, performance of Fabry-Perot etalons in the soft x-ray range is discussed. The observation of the Cu 2p emission spectrum obtained with an optimized LSM dispersor provides a specific example of LSM possibilities for x-ray spectroscopy.
Mohammed Arbaoui, Robert Barchewitz, Jean-Michel Andre, Yves Lepetre, Rene Rivoira, "Performance Of A Layered Synthetic Microstructure Spectrogoniometer For Characteristic X-Ray Lines," Optical Engineering 25(11), 251207 (1 November 1986). https://doi.org/10.1117/12.7973983 . Submission:
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