1 May 1986 Speckle Polarization Investigated By Novel Ellipsometry
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Abstract
The polarization characteristics of speckle patterns are investigated by a novel ellipsometric approach. The method is based on the illumination of the scattering object by a plane-polarized light beam with its polarization plane rotating. The speckle pattern produced by the scattered light is then investigated for its polarization characteristics. An approximate theory is outlined and compared with experimental measurements demonstrating the usefulness of the method as a powerful surface analytic tool.
Joseph Shamir, "Speckle Polarization Investigated By Novel Ellipsometry," Optical Engineering 25(5), 255618 (1 May 1986). https://doi.org/10.1117/12.7973874 . Submission:
JOURNAL ARTICLE
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