1 February 1987 Charge-Coupled Device Advances For X-Ray Scientific Applications In 1986
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Optical Engineering, 26(2), 262156 (1987). doi:10.1117/12.7974042
A theoretical model is presented that predicts the output response of a thinned CCD to soft x-ray spectra. The model simulates the four fundamental parameters that ultimately limit CCD performance: quantum efficiency, charge collection efficiency, charge transfer efficiency, and read noise. Simulated results are presented for a wide variety of CCD structures, and general conclusions are presented about achieving a practical balance of sensitivity, energy, and spatial resolution for an Advanced X-ray Astrophysics Facility (AXAF) instrument. We compare the results of the analysis to existing state-of-the-art CCDs and project improvements that will be made in the near future.
James R. Janesick, Tom Elliott, Stewart Collins, Taher Daud, Dave Campbell, Gordon Garmire, "Charge-Coupled Device Advances For X-Ray Scientific Applications In 1986," Optical Engineering 26(2), 262156 (1 February 1987). https://doi.org/10.1117/12.7974042

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