1 February 1987 Charge-Coupled Device Advances For X-Ray Scientific Applications In 1986
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Abstract
A theoretical model is presented that predicts the output response of a thinned CCD to soft x-ray spectra. The model simulates the four fundamental parameters that ultimately limit CCD performance: quantum efficiency, charge collection efficiency, charge transfer efficiency, and read noise. Simulated results are presented for a wide variety of CCD structures, and general conclusions are presented about achieving a practical balance of sensitivity, energy, and spatial resolution for an Advanced X-ray Astrophysics Facility (AXAF) instrument. We compare the results of the analysis to existing state-of-the-art CCDs and project improvements that will be made in the near future.
James R. Janesick, James R. Janesick, Tom Elliott, Tom Elliott, Stewart Collins, Stewart Collins, Taher Daud, Taher Daud, Dave Campbell, Dave Campbell, Gordon Garmire, Gordon Garmire, } "Charge-Coupled Device Advances For X-Ray Scientific Applications In 1986," Optical Engineering 26(2), 262156 (1 February 1987). https://doi.org/10.1117/12.7974042 . Submission:
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