1 March 1987 Current Readout Of Infrared Detectors
Author Affiliations +
A buffered direct-injection (BDI) current readout for infrared detectors is described and analyzed. It is compared with the common direct-injection (DI) circuit with respect to injection efficiency, noise, and tolerance of low RoA product photovoltaic detectors. Power requirements and threshold control are also discussed. Throughout the analysis it is clear that much advantage is gained at relatively little cost by the use of a BDI structure for an integrated circuit focal plane.
Nathan Bluzer, Nathan Bluzer, Arthur S. Jensen, Arthur S. Jensen, } "Current Readout Of Infrared Detectors," Optical Engineering 26(3), 263241 (1 March 1987). https://doi.org/10.1117/12.7974057 . Submission:


The Effect Of The Surface Layer Electric Field On The...
Proceedings of SPIE (November 09 1987)
Lithography Limited Yield Analysis
Proceedings of SPIE (July 22 1985)
Balanced Common Module Coolers
Proceedings of SPIE (October 03 1979)
Photomasks For Micron Geometry Transistors
Proceedings of SPIE (September 19 1976)
Automated lithocell
Proceedings of SPIE (May 31 1990)

Back to Top