Most of the defects present in manufactured glass are caused by rare explosions of hot jars and bottles on the assembly line. These explosions create particles of flying glass that may stick to the inside bottoms of other jars on the line. In this paper we present experimental results of a prototype optoelectronic inspection system that detects submillimeter stuck-glass defects. In the system described, we use a two-dimensional spatial light modulator to create in real time a unique mask for each glass jar inspected. This allows us to compensate for variations in acceptable features on the bottoms of the jars such as mold marks and lettering while detecting the presence of unacceptable features such as stuck-glass defects.