1 May 1988 Instrumentation To Measure The Diffuse Thickness Of Scattering Dispersions
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Abstract
An instrument has been developed for measuring the light scattering associated with diffuse reflectance measurements. The instrument measures the sample thickness necessary to bring about diffusion of the transmitted radiation, i.e., the diffuse thickness. This quantity is inversely proportional to the light scattering coefficient as defined by the Kubelka-Munk equations. Results have shown the measurement to be independent of absorption and inversely proportional to particle density in the sample.
Gerald S. Birth, Gerald S. Birth, Per-Gunnar Fyhn, Per-Gunnar Fyhn, Joseph Frank, Joseph Frank, } "Instrumentation To Measure The Diffuse Thickness Of Scattering Dispersions," Optical Engineering 27(5), 275403 (1 May 1988). https://doi.org/10.1117/12.7976690 . Submission:
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