1 January 1989 Direct Measurements Of Phase Matching Properties In Small Single Crystals Of New Nonlinear Materials
Author Affiliations +
Optical Engineering, 28(1), 280176 (1989). doi:10.1117/12.7976905
Abstract
Direct phase matching measurements are a powerful way to characterize the frequency conversion properties of small (submillimeter) crystals of new nonlinear materials. These measurements represent a level of characterization lying between powder tests and detailed refractive index and d coefficient determinations. Since crystals as small as 100um can be studied, a decision to pursue the development of a material can be made at an early stage of crystal growth. Representative data on some new harmonic generators are presented to illustrate various features of the technique.
Stephan P. Velsko, "Direct Measurements Of Phase Matching Properties In Small Single Crystals Of New Nonlinear Materials," Optical Engineering 28(1), 280176 (1 January 1989). http://dx.doi.org/10.1117/12.7976905
JOURNAL ARTICLE
9 PAGES


SHARE
KEYWORDS
Crystals

Nonlinear crystals

Phase matching

Phase measurement

Frequency conversion

Refractive index

RELATED CONTENT

Rigorous study of leaky modes in optical waveguides
Proceedings of SPIE (March 26 1999)
Efficient bending compensation of large mode area fiber
Proceedings of SPIE (November 18 2014)
Liquid crystal microlens and improvement of the properties
Proceedings of SPIE (October 14 1999)
Ultra-Wide Waveband Optics
Proceedings of SPIE (January 19 1984)

Back to Top