1 February 1989 Infrared Spectropolarimetry
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Optical Engineering, 28(2), 282120 (1989). doi:10.1117/12.7976918
Abstract
This paper treats the fundamentals of infrared spectropolarimetry as a step in understanding electro-optical materials and designing better spatial light modulators. It describes the issues in converting a Fourier transform spectrometer to perform spectropolarimetric measurements and includes mathematics to interpret the resulting spectropolarimetric data. Two distinct differences exist between this proposed instrumentation and previous infrared crystal optics studies: (1) this instrument acquires data simultaneously at all wavelengths within its spectral range and (2) it measures Mueller polarization matrices. Conventional measure-ments with laser polarimeters take birefringence data with applied fields at a few laser wavelengths. With the spectropolarimeter, data are obtained over the entire spectrum, including on and near absorption bands where the most interesting phenomena occur. Measuring Mueller matrices as a function of wavelength provides data on polarization and scattering, effects that will ultimately limit the performance of a modulating crystal. Thus, more data are available with which to compare materials and optimize modulator designs. Better modulators must result from such investigations.
Dennis H. Goldstein, Russell A. Chipman, David B. Chenault, "Infrared Spectropolarimetry," Optical Engineering 28(2), 282120 (1 February 1989). http://dx.doi.org/10.1117/12.7976918
JOURNAL ARTICLE
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KEYWORDS
Infrared radiation

Infrared spectroscopy

Electro optical design

Modulators

Polarization

Data conversion

Electro optics

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