1 March 1989 Interferometry On Wolter X-Ray Optics: A Possible Approach
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Optical Engineering, 28(3), 283217 (1989). doi:10.1117/12.7976937
Abstract
A novel interferometric approach for obtaining surface interferograms on Wolter-type optics is presented. A subaperture simulation experiment shows the data analysis steps required. A second, independent test basically confirms the simulation results. Splicing of the subaperture interferograms around the circumference is discussed.
Josenh M. Geary, "Interferometry On Wolter X-Ray Optics: A Possible Approach," Optical Engineering 28(3), 283217 (1 March 1989). https://doi.org/10.1117/12.7976937
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