1 March 1989 Interferometry On Wolter X-Ray Optics: A Possible Approach
Author Affiliations +
Optical Engineering, 28(3), 283217 (1989). doi:10.1117/12.7976937
Abstract
A novel interferometric approach for obtaining surface interferograms on Wolter-type optics is presented. A subaperture simulation experiment shows the data analysis steps required. A second, independent test basically confirms the simulation results. Splicing of the subaperture interferograms around the circumference is discussed.
Josenh M. Geary, "Interferometry On Wolter X-Ray Optics: A Possible Approach," Optical Engineering 28(3), 283217 (1 March 1989). http://dx.doi.org/10.1117/12.7976937
JOURNAL ARTICLE
5 PAGES


SHARE
KEYWORDS
Interferometry

X-ray optics

Data analysis

RELATED CONTENT

Wavefront integration from difference data
Proceedings of SPIE (February 05 1993)
Angular Interferometers For Laser Scanners
Proceedings of SPIE (April 03 1989)
Propagation of angular cross-spectral density and 3D imaging
Proceedings of SPIE (October 01 1999)
Developments in 2D AFM metrology
Proceedings of SPIE (August 04 1993)

Back to Top