1 March 1989 Optical Reflection Measurement System Using A Swept Modulation Frequency Technique
Author Affiliations +
Optical Engineering, 28(3), 283286 (1989). doi:10.1117/12.7976947
Abstract
A measurement system has been developed capable of mea-suring reflected optical power as low as 0.0025% with a spot size diam-eter of 24 Am. One application for this system is the characterization of small-area photodetectors. The operation of the measurement system is simple, allowing the operator to quickly make multiple reflection measurements, and it does not require a darkroom. The measurement system merges a microscope, for visual alignment and focusing of the laser beam, with a lightwave component analyzer using modulation vec-tor error correction. A measurement comparison between the analyzer-based system and a power-meter-based system showed that each sys-tem can measure reflections as low as 0.0025%. However, the analyzer-based system offers the advantage of identifying the location and magnitude of system reflections. The system operates at a wavelength of 1310 nm.
David M. Braun, Kent W. Leyde, "Optical Reflection Measurement System Using A Swept Modulation Frequency Technique," Optical Engineering 28(3), 283286 (1 March 1989). http://dx.doi.org/10.1117/12.7976947
JOURNAL ARTICLE
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KEYWORDS
Modulation

Optical testing

Americium

Error analysis

Microscopes

Photodetectors

Visual analytics

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